| Pealkiri |
Proceedings of the 2012 IEEE 15th international symposium on design and diagnostics of electronic circuits & systems (DDECS) : April 18-20, 2012 Tallinn, Estonia / sponsored by IEEE Computer Society, Test Technology Technical Council ; in cooperation with Department of Computer Engineering of Tallinn University of Technology, Estonia ; [editors: Jaan Raik ... [et al.]] |
| Ilmunud |
[New York?] : IEEE, c2012 (Tallinn : Tallinn University of Technology press) |
| Kirjeldus |
[10], 386 lk. : ill. ; 28 cm |
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